OpenMV.net Datasets

Description:	Thickness of a single wafer, measured at 9 locations for 184 consecutive batches. A single wafer is removed from a tray of wafers (always at the same position for each batch of wafers) after the chemical vapour decomposition process is complete.
Data source:	Industrial data (origin unknown). The data have been approximately centered and scaled to disguise the original variables - for confidentiality. The location of the 9 thicknesses are:
Data shape:	184 rows and 9 columns
Usage restrictions:	None
Contact person:	Kevin Dunn
Contact details:	kgdunn@gmail.com
Added here on:	27 March 2011 20:45
Last updated:	11 November 2018 16:35

Preview (first 10 rows)

G1	G2	G3	G4	G5	G6	G7	G8	G9
0.175	0.188	-0.159	0.095	0.374	-0.238	-0.8	0.158	-0.211
0.102	0.075	0.141	0.18	0.138	-0.057	-0.075	0.072	0.072
0.607	0.711	0.879	0.765	0.592	0.187	0.431	0.345	0.187
0.774	0.823	0.619	0.37	0.725	0.439	-0.025	-0.259	0.496
0.504	0.644	0.845	0.681	0.502	0.151	0.404	0.296	0.26
0.57	0.729	0.879	0.624	0.588	0.204	0.435	-0.018	0.354
0.885	0.932	0.878	0.662	0.839	0.917	0.593	0.252	0.801
-0.029	0.065	0.258	0.078	-0.053	-0.456	-0.153	-0.356	-0.379
1.396	1.461	1.342	1.122	1.394	1.408	0.924	0.638	1.375
0.389	0.428	0.332	0.466	0.35	0.539	-0.159	-0.459	0.259

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Tags for this dataset

multivariate outliers